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NSX: HITACHI - Nhật Bản
THÔNG TIN CHI TIẾT
Máy đo hàm lượng kim loại XRF Analyzer EA1000AIII
Features
1. Low Cost Entry Model
Newly employed silicon semiconductor detector and speed-up of electric control system and mechanical drive system enables shortening measurement time by 1/3 compared to the conventional model (SEA1000AII) while price remains same as SEA1000AII.
Hazardous Substance Measurement Software Ver.2 that used to be an optional is now standard equipment.
2.The hazardous substance measurement function was enhanced by various new functions in Hazardous Substance Measurement Software Ver.2 – Material ID Function
Able to identify materials of different types of samples rapidly from the start of the measurement. With conventional model, an analytical recipe had to be selected by the operator first, but now analysis recipe is selected automatically by the analyzer.
3. Improved operability – Operation Panel –
The operation panel has indicators and electronic sounds keeps you aware of measurement status. The progress bar on the measurement panel lets you follow the progress of a measurement.
4. Standard reference materials for various environmental regulations (optional)
Other than the RoHS directive controlled elements (Cd, Pb, Cr, Hg, Br), we also developed and manufacture standard reference materials that support control of chlorine, antimony, tin, etc.
5. Sample Changer (optional)
Sample changer enables continuous measuring of up to 12 samples.
6. Centralized data and trend control by Hazardous Substance Measurement Software Ver.2
Measuring time was, of course, reduced by precision control software, inspection efficiency improved and the cost reduced by central control of measurement data (Search, CC, Analyze, Edit, Print, Report create) used in a data base.
Specifications
| Elements | Atomic Number: 13 (Al) to 92 (U) | |
|---|---|---|
| Sample type | Solid, Powder, Liquid | |
| X-ray source | X-ray tube (Rh target) Voltage: 15 kV, 40kV, 50 kV Current: 1 mA (10μA to 1,000μA variable) |
|
| X-ray irradiation direction | Bottom-Up method | |
| Detector | Si semiconductor detector (Liquid nitrogen not required) | |
| Analysis Area | 1 mm, 3 mm, 5 mm (automatic switching) | |
| Sample imaging | Color CCD camera | |
| Sample chamber | 370(W)×320(D)×120(H)mm | |
| Filters | 5 mode automatic switching (including OFF) | |
| Operation unit | Laptop or Desktop personal computer | |
| Software |
·X-ray Station Qualitative Analysis (Spectrum measurement, Automatic ID, KLM Marker Display, Compare/Subtract Displays) Quantitative Analysis (Bulk FP, Bulk Calibration) Routine Measure ·Environmentally regulated substance measurement software Ver. 2 |
|
| Data Processing | Microsoft Excel, Microsoft Word | |
| Power usage | AC 100V to 240V ±10%, single phase | |
| Accessory parts |
|
Options
- Sample Changer (turret) that holds up to 12 samples
- Film Analysis FP software
- Film Analysis Calibration software
- Spectrum Matching (Compares with the spectrum of registered standard samples)
- Environmentally regulated substance measurement software Ver.1
- Various types of standard sample (Standards samples for environmentally control, Pb free solder standard samples, Pb free solder film standard samples)
- Signal tower
- Printer
* “Microsoft”, “Excel” and “Word” are registered trademarks of Microsoft Corporation in the United States and other countries.
* Vortex is a registered trademark of Hitachi High-Technologies Science America, Inc. in the United States and a registered trademark of Hitachi High-Tech Science Corporation in Japan.
